Comparison ledger
Advantest T 5365, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5365Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5365 | KLA 1007 |
| Cited variants |
| — |
| Specifications | ||
| Configuration | parts machine[2] | — |
| System Type | Memory Test System[1] | — |
| Y2K Readiness | Year 2000 ready from revision 6.04[1] | — |
| MOST based system | No[1] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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