Comparison ledger
Advantest T 5371, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5371Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5371 | KLA 1007 |
| Specifications | ||
| Configuration | For Parts[1] | — |
| Device types | DRAM, SDRAM, CDRAM, SRAM, Flash memory, Direct RDRAM, EPROM, masked ROM[2] | — |
| Test frequency | 70 MHz[2] | — |
| Timing accuracy | 800 ps[2] | — |
| Maximum channels | 128[2] | — |
| Test head | up to 2 stations, HV drive option[2] | — |
| Timing patterns | 27 timing edges/row, 16 timing sets/row[2] | — |
| Pattern format | ALPG 16X, 16Y, 18D x 2[2] | — |
| DC test unit | up to 32 units[2] | — |
| Programmer units | up to 128 units[2] | — |
| Attachments | 36 Files[3] | — |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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