Comparison ledger
Advantest T 5588, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5588Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5588 | KLA 1007 |
| Specifications | ||
| Configuration | (4) Bays[1] | — |
| Frequency | 800 MHz[1] | — |
| Test Speed | 400 MHz / 800 Mbps[2] | — |
| Maximum Devices per System | 512[2] | — |
| Target Devices | DDR2-SDRAM, Flash memory[2] | — |
| Operating System | FutureSuite (multi-threaded)[2] | — |
| Number of Test Heads | 1[1] | — |
| Number of Bays | 4[1] | — |
| Maximum Frequency | 800 MHz[1] | — |
| IO Channels | 3072[1] | — |
| DR Channels | 3584[1] | — |
| PPS Channels | 512[1] | — |
| DC Channels | 64[1] | — |
| Vintage | 2010[1] | 01.06.1995[3] |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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