Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Hitachi S 4700 FE-SEM, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | S 4700 FE-SEMHitachi |
|---|---|---|
| OEM | Applied Materials | Hitachi |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Hitachi S 4700 |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | Windows NT 4.0[3] |
| Phase | — | 1 Phase[2] |
| Power | — | 4 kVA[2] |
| Frequency | — | 60 Hz[2] |
| Wafer size | — | 4 inch[6] |
| Control system | — | Windows NT 4.0[3] |
| Accessories | — | Oxford 7200 EDS[3] |
| Vintage | — | 1997[6] |
| OEM | — | Hitachi[6] |
| Model | — | S 4700[6] |
| Tool type | — | Field Emission Scanning Electron Microscope (FE-SEM)[6] |
| Included accessory | — | Oxford 7200 EDS[3] |
| Control platform | — | Windows NT 4.0[3] |
| Power/configuration | — | 1 Phase - 4 kVA - 60 Hz[2] |
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