Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, JEOL JEM-7, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | JEM-7JEOL |
|---|---|---|
| OEM | Applied Materials | JEOL |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | 1964 |
| Production run | — | 1964– |
| Lifecycle | — | Legacy |
| Lifecycle milestones | — | 1964 Introduction |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | JEOL JEM-7 |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | — |
| Manufacturer | — | JEOL[2] |
| Model | — | JEM-7[2] |
| Type | — | Electron microscope[2] |
| Introduced | — | 1964[2] |
| Notable feature | — | First electron microscope to include a mechanism for electrical adjustment of the lens axis[2] |
| First electronic microscope with electrical lens axis adjustment | — | Yes[2] |
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