Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Malvern Panalytical Empyrean, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | EmpyreanMalvern Panalytical |
|---|---|---|
| OEM | Applied Materials | Malvern Panalytical |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Malvern Panalytical Empyrean |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | — |
| Voltage | — | 230 V[2] |
| Frequency | — | 60 Hz[2] |
| Power | — | 8 kVa[2] |
| Max. Current | — | 38 A rms[2] |
| X-ray generator maximum power | — | 4 kW (max 60 kV, max 100 mA)[3] |
| Goniometer reproducibility | — | ≤±0.0001°[3] |
| 2θ linearity | — | ±0.01°[3] |
| Maximum goniometer speed | — | 15 deg/s[3] |
| Resolution (FWHM on LaB₆) | — | 0.026°[3] |
| Dimensions (W x D x H) | — | 1400 × 1162 × 1947 mm[3] |
| Weight | — | 1150 kg[3] |
| Power supply | — | Single phase 210–230 V (±10% grid variations), 50/60 Hz[3] |
| Power consumption | — | Max. 4.6 kVA without controllers for optional equipment[3] |
| External cooling water supply | — | 4–6 liters/min, pressure up to 8 bar, temperature 15 to 35 °C[3] |
| Compressed air supply | — | 2–5 bar (0.2–0.5 MPa)[3] |
| Radiation level | — | Less than 1 microSievert per hour at 10 cm distance (Mo source @ 60 kV, 50 mA)[3] |
| Detector types | — | PIXcel1D, PIXcel3D, GaliPIX3D; also 1Der, point detectors (proportional counter, scintillation detector)[3] |
| Capabilities | — | X-ray diffraction (XRD), small- and wide-angle X-ray scattering (SAXS/WAXS), X-ray reflectivity, X-ray absorption spectroscopy (XAS), grazing incidence XRD, pair distribution function, texture mapping, residual stress measurement, computed tomography[3] |
| Source wavelengths | — | Cu Kα₁; also Mo radiation[4] |
| Temperature range for in situ stages | — | -200 °C to 1100 °C[5] |
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