Comparison ledger
Electroglas 1034, Zeiss Contura G 2 CMM, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1034Electroglas | Contura G 2 CMMZeiss |
|---|---|---|
| OEM | Electroglas | Zeiss |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas 1034 | Zeiss Contura G 2 CMM |
| Specifications | ||
| Configuration | — | 7.7.6 RDS[1] |
| Software | — | Calypso 2019[1] |
| Measuring Range | — | 700 x 700 x 600 mm[2] |
| Manufacturer | — | Zeiss[1] |
| Model | — | Contura G 2[1] |
| Equipment type | — | Coordinate Measuring Machine (CMM)[1] |
| Category | — | Dimensional Calibrators[3] |
| Probe head | — | RDS Probe Head[1] |
| Scanning probe | — | Vast XXT Scanning Probe[1] |
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