Comparison ledger
Espec EHS-412(M), Tektronix 11401 Oscilloscope, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EHS-412(M)Espec | 11401 OscilloscopeTektronix |
|---|---|---|
| OEM | Espec | Tektronix |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Espec EHS-412(M) | — |
| Specifications | ||
| Type | Large highly accelerated stress test system[1] | — |
| Temperature range | +105.0°C to +162.2°C[1] | — |
| Humidity range | 75%rh to 100%rh[1] | — |
| Pressure range | 0.019 to 0.389 MPa (gauge)[1] | — |
| Interior dimensions | φ294×L318 mm[1] | — |
| Related standard | IEC 60068-2-66[1] | — |
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