Comparison ledger
Ismeca NY32, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NY32Ismeca | 1007KLA |
|---|---|---|
| OEM | Ismeca | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Ismeca NY32 | KLA 1007 |
| Specifications | ||
| Platform type | 32-position turret platform[1] | — |
| Function | Semiconductor test, inspection and packaging[1] | — |
| Test/inspection focus | Test and inspection of high performance mixed signal, high frequency and sensor devices[1] | — |
| Throughput | Up to 30,000 UPH[1] | — |
| Test sites | Up to 16 Test Sites[1] | — |
| Inspection capability | 6-sided Optical and Infrared Inspection[1] | — |
| Package size range | 0.3 x 0.6 mm to 17 x 17 mm[1] | — |
| Supported device/package types | Discrete, Power Discrete, DFN/QFN, SOIC, LED, BGA, MEMS, WLCSP, Bare Die, Bumped Die[1] | — |
| Outputs | Output Tube Output; Tape and Reel Output[1] | — |
| Inspection technologies | NV-Core Inspection System; Aquilae HR Sidewall; Aquilae Infrared; 3D Flex vision[1] | — |
| Software platform | PAICe Digital Twin Platform[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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