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Comparison ledger

RC2versus05 LHP 151

J.A. Woollam RC2, Melles Griot 05 LHP 151, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
RC2J.A. Woollam
05 LHP 151Melles Griot
OEMJ.A. WoollamMelles Griot
CategoryPrecision OpticsPrecision Optics
Wafer size200mm—
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyJ.A. Woollam RC2Melles Griot 05
Specifications
Instrument typeSpectroscopic ellipsometer[1]—
Measured quantitiesThicknesses and refractive indices of thin films[1]—
Substrate sizeUp to 200 mm wafers; chips with a surface larger than the cross section of the incident beam[1]—
Light sourceXenon Arc lamp 75W[1]—
Wavelength range210 nm to 2500 nm[1]—
Spot size without focusing probes3 to 4 mm beam diameter[1]—
Spot size with focusing probes120 microns beam diameter[1]—
StageMotorized XY stage mapping[1]—
Vertical motionMotorized Z and autofocus[1]—
AlignmentAutomatic tilt alignment[1]—
SoftwareCompleteEASE[1]—
Equipment typeSpectroscopic ellipsometer[1]Laser[2]
Measurement capabilityMeasures thicknesses and refractive indices of thin films (transparent or not)[1]—
Measureable material classesDielectric and semiconductor films (silicon dioxide, silicon nitride, polysilicon, amorphous silicon); metallic films; organic layers such as carbon and photosensitive resists[1]—
Measurement principleMeasures the ratio of reflection coefficients Rp/Rs expressed as Ψ and Δ; refractive index (n) and thickness (t) are resolved by an algorithm from measured Ψ and Δ values[1]—
Configuration—With 05 LPL 340 Power Supply (Does not power on)[2]
Make—Melles Griot[2]
Model—05 LHP 151[2]
Power state—Does not power on[2]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]epfl.chepfl.ch
  2. [2]inventory listing
  3. [3]waferpedia.comwaferpedia.com