Comparison ledger
KLA 1007, Teradyne J 750 HD, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | J 750 HDTeradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne J 750 HD |
| Cited variants | — |
|
| Specifications | ||
| Manufacturer | KLA[2] | — |
| Model | 1007[2] | — |
| Description | Wafer Prober[2] | — |
| Wafer size | 150 mm[2] | — |
| Convertible to 8 inch wafer size | Yes[2] | — |
| Vintage | 01.06.1995[2] | — |
| Make | KLA[3] | — |
| Equipment type | Prober[3] | — |
| Configuration | — | HSD 800 (6)[4] |
| Type | — | Tester[4] |
| Testhead | — | Included[4] |
| Computer | — | Included[4] |
| Power Conditioner | — | Included[4] |
| Manipulator | — | Not included[4] |
| HSD 800 modules | — | 6[4] |
| HDCUB module | — | 1[4] |
| HDDPS24 modules | — | 4[4] |
| HDDPS48 module | — | 1[4] |
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