Comparison ledger
Agilent 11980 A, Perkin Elmer Lambda 1050 UV-VIS-NIR Spectrophotometer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | Lambda 1050 UV-VIS-NIR SpectrophotometerPerkin Elmer |
|---|---|---|
| OEM | Agilent | Perkin Elmer |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | Ideal for photovoltaic, wafer, and coating characterization (solar cell reflectance and antireflection studies) |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | Perkin Elmer Lambda |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| Configuration | — | With Integrating Sphere[2] |
| Wafer size | — | Ideal for photovoltaic, wafer, and coating characterization (solar cell reflectance and antireflection studies)[3] |
| Detector module | — | Interchangeable 3-detector module with PMT, InGaAs, and PbS detectors[3] |
| Sample handling | — | Horizontal sampling plate for delicate samples[3] |
| Optional accessories | — | Integrating sphere (150 mm / 6 inch); Universal Reflectance Accessory (URA) for automated multi-angle reflectance[3] |
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