Comparison ledger
Applied Materials Complus MP Patterned Wafer, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Complus MP Patterned WaferApplied Materials | |
|---|---|---|
| OEM | Applied Materials | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | KLA 0035235-003 MMD Head |
| Cited variants |
| — |
| Specifications | ||
| Manufacturer | Applied Materials[2] | — |
| Model | Complus MP[3] | 0035235-003[4] |
| Category | Metrology & Inspection[2] | — |
| Description | Patterned wafer inspection system[1] | — |
| Factory interface | 200 mm OPEN Cassette Adaptor[1] | — |
| System options | SECS/GEM + HSMS[1] | — |
| Tool type | Patterned wafer inspection system[2] | — |
| Configuration | — | TSTD PCB ASSY, MMD MEAS HEAD[4] |
| Make | — | KLA[4] |
| Part Description | — | TSTD PCB ASSY, MMD MEAS HEAD[4] |
| Compatible System | — | KLA AIT-XP[4] |
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