Comparison ledger
Cascade Microtech 11000, Espec EHS-432(M)-L, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11000Cascade Microtech | EHS-432(M)-LEspec |
|---|---|---|
| OEM | Cascade Microtech | Espec |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech 11000 | Espec EHS-432(M)-L |
| Specifications | ||
| Configuration | With antivibration table[1] | — |
| Category | — | Large highly accelerated stress test system[3] |
| Model | — | EHS-432(M)-L[3] |
| Temperature range | — | +105.0°C to +162.2°C[3] |
| Humidity range | — | 75%rh to 100%rh[3] |
| Pressure range | — | 0.0196 MPa to 0.392 MPa gauge[3] |
| Interior dimensions | — | φ560×L 760 mm[3] |
| Capacity | — | 180 L[3] |
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