Comparison ledger
Cohu MT9928, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MT9928Cohu | 1007KLA |
|---|---|---|
| OEM | Cohu | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cohu MT9928 | KLA 1007 |
| Specifications | ||
| Handler type | Gravity test handler[1] | — |
| Use with MEMS modules | Can be configured with Cohu MT9928 tri-temp test handler for automatic loading / unloading[1] | — |
| Temperature range | –40°C to +140°C[1] | — |
| Device size support | Leaded devices 150 mil to 300 mil; leadless devices 3 mm to 11 mm[1] | — |
| Index time | 2.2 s for any package[1] | — |
| Configuration | Can be configured with Cohu MT9928 tri-temp test handler for automatic loading / unloading[1] | — |
| Throughput | Up to 28,000 UPH[2] | — |
| Test sites | Up to 8 test sites[2] | — |
| Temperature accuracy | +/- 2°C[2] | — |
| Installed base | >1,300[2] | — |
| Package sizes | MSOP 118 mil to SO 430 mil; QFN 2 mm to QFN 11 mm; supports lead pitch down to 0.4 mm[2] | — |
| Input and output | Tube, Metal Magazine and Bowl/Bulk[2] | — |
| Kit conversion time | ~1 hour[2] | — |
| MEMS test | Magnetic sensor stimuli for MEMS available[2] | — |
| Supported modules | MEMS and sensor test modules[3] | — |
| Automation | Can be configured with MEMS modules for automatic loading and unloading[3] | — |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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