Comparison ledger
CyberOptics SQ 3000 3D AOI, KLA 1.112 PSL Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | SQ 3000 3D AOICyberOptics | |
|---|---|---|
| OEM | CyberOptics | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | CyberOptics SQ 3000 | KLA 1.112 PSL Wafer |
| Specifications | ||
| P/N | 8021880[1] | — |
| Configuration | PSX3D Multi Camera + Projector 3D Sensor featuring MRS Technology[1] | NIST Traceable[2] |
| Workstation (P/N | 8022409):[1] | — |
| CyberReport SPC Software (P/N | 80022384):[1] | — |
| OEM | CyberOptics[1] | — |
| Model | SQ 3000 3D AOI[1] | — |
| Inspection type | Automated Optical Inspection (AOI)[1] | — |
| Sensor | PSX3D multi-camera + projector 3D sensor featuring MRS Technology[1] | — |
| Inspection capability | 20 x 20 in[1] | — |
| Conveyor | Auto-width adjust conveyor[1] | — |
| Board stop | Mechanical board stop[1] | — |
| Software | AI image analysis software[1] | — |
| User interface | Localized operator user interface[1] | — |
| Included monitor | Touch screen monitor[1] | — |
| Default conveyor direction | Left to right movement[1] | — |
| Workstation | Offline programming and defect review workstation included[1] | — |
| CyberReport SPC software | Machine-level SPC software with historical charting analysis and USB license dongle[1] | — |
| Wafer Size | — | 8 inch[2] |
| NIST Traceable | — | True[2] |
| Compatible Tools | — | Surfscan 6xy0 and Sp1[3] |
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