Waferpedia

Comparison ledger

1034versusX-Series LX 20 ATE

Electroglas 1034, LTX-Credence X-Series LX 20 ATE, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
1034Electroglas
X-Series LX 20 ATELTX-Credence
OEMElectroglasLTX-Credence
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyElectroglas 1034LTX-Credence X-Series
Specifications
Configuration—With Docking and Manipulator from Turbodynamics[1]
Slot 1—Instrument: SSBA[1]
Slot 2—Instrument: OVI[1]
Slot 3—instrument: Empty[1]
Slot 4—Instrument: DCTM[1]
Slot 5—Instrument: Empty[1]
Slot 6—Instrument: Empty[1]
Slot 7—Instrument: QFVI[1]
Slot 8—Instrument: HEXVI 16[1]
Slot 9—Instrument: AWG_HR[1]
Slot 10—Instrument: Empty[1]
Slot 11—Instrument: QFVI[1]
Slot 12—Instrument: Empty[1]
Slot 13—Instrument: Empty[1]
Slot 14—Instrument: Empty[1]
Slot 15—Instrument: FX 1_PEC[1]
Slot 16—Instrument: FX 1_PEC[1]
Slot 17—Instrument: FX_TMBD[1]
Slot 18—Instrument: FX 1_PEC[1]
Slot 19—Instrument: FX 1_PEC[1]

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Sources (1)Every fact above is drawn from these public sources
  1. [1]inventory listing