Comparison ledger
KLA 1007, Logitech LG2, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | LG2Logitech |
|---|---|---|
| OEM | KLA | Logitech |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Logitech LG2 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Power supply | — | 90-260V 50/60Hz[3] |
| Typical setting accuracy | — | Better than 2 arc seconds[3] |
| Aperture | — | 30mm[3] |
| Optical reference flatness | — | Lamda/8[3] |
| Adjustment range | — | ±25 minutes of arc[3] |
| Optical Reference Flatness | — | Lambda/8[3] |
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