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Comparison ledger

Plasmalab-80plus-Cloey-Sversus6540

Oxford Instruments Plasmalab-80plus-Cloey-S, Tegal 6540, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
Plasmalab-80plus-Cloey-SOxford Instruments
6540Tegal
OEMOxford InstrumentsTegal
CategoryEtchEtch
Wafer size100mm100mm
Process node—down to 90nm
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyOxford Instruments Plasmalab-80plus-Cloey-STegal 6540
Cited variants—
Specifications
Process gasesBCl3, Cl2, N2, CF4, O2, Ar[2]—
UseEtching of compound semiconductors and metals[2]—
Allowed masksPhotoresist and dielectrics[2]—
Platen size238 mm[2]—
Power range< 270 Watts[2]—
MFC flow range - BCl30 – 100 sccm[2]—
MFC flow range - Cl20 – 50 sccm[2]—
MFC flow range - CF40 – 100 sccm[2]—
MFC flow range - O20 – 50 sccm[2]—
MFC flow range - Ar0 – 100 sccm[2]—
MFC flow range - N20 – 100 sccm[2]—
Pressure range< 250 mTorr[2]—
Wafer size100 mm designed size; 200 mm maximum[2]100mm – 200mm[1]
Type—high-density plasma etch system[3]
Reactor—HRe reactor / HRe™ reactor[3]
Plasma technology—dual-frequency RF power technology / dual-frequency RF power application[3]
Plasma confinement—magnetic plasma confinement[3]
Optimized design rule—down to 0.13 micron[3]
RF power—dual-frequency RF power application[1]
Design rule—optimized for device design rules down to 90nm[1]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org
  2. [2]cores.research.asu.educores.research.asu.edu
  3. [3]web.archive.orgweb.archive.org
  4. [4]web.archive.orgweb.archive.org