Tool family
The KLA Archer 10 is an automated overlay registration measurement system that uses a coherence probe interference microscope.
Cited variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Archer 10 XT Overlay | — | — | Refurbishment-upgraded components and software version 5.6; XP computer upgrade; KLASS RS2 computer; 5 AMS; digitizer; LINNIK; PDA; PZT-P-Z feedback | waferpedia.com[1] |