Accretech
The Accretech 3000 EX is a prober. The Accretech 3000 EX has tri-temp capability. The Accretech 3000 EX requires 200 VAC single-phase power.[1][2]

A wafer prober positions a semiconductor wafer under a probe interface for electrical testing at the die level.
A probe system aligns the wafer and probe contacts, then supports temperature-controlled testing when fitted for thermal operation.
The Accretech 3000 EX supports wafer-level test and probe work at the stage where die are electrically exercised on the wafer.[1]
The Accretech 3000 EX is used for wafer-level electrical testing.[1]
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The following facts about the 3000 EX are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 3000 EX are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 3000 EX are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 3000 EX are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 3000 EX are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 3000 EX is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 5, 2026.
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