Advantest
93000 PS 1600
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Advantest 93000 PS 1600 is a tester in the Test & Probe category. The Advantest 93000 PS 1600 is configured as a semiconductor test system with 48 PS1600 channel boards and related DUT interface, RF, DCS-DPS32, and measurement assemblies. The Advantest 93000 PS 1600 uses an ATH (Advanced Test Head) configuration.[1][2]
What it is
The Advantest 93000 PS 1600 is a semiconductor test system.[3][1][2]
The 93000 PS 1600 Pin Scale Tester is configured with 48 PS1600 channel boards and related DUT interface, RF, DCS-DPS32, and measurement assemblies.[1]
The Advantest V 93000 PS 1600 tester uses an ATH (Advanced Test Head) configuration.[2]
How it works
General reference — not yet source-verifiedSemiconductor test systems apply electrical stimuli to integrated circuits on a wafer or in a packaged device and measure the resulting responses to verify functionality and performance.
The DUT interface connects the tester to the device under test through a probe card or a test socket.
Where it fits in the process flow
General reference — not yet source-verifiedThe 93000 PS 1600 is used in the final test step of semiconductor manufacturing.
Wafer-level test occurs after wafer fabrication and prior to dicing, while packaged-device test occurs after assembly and packaging.
Applications
General reference — not yet source-verifiedThe system tests digital, mixed-signal, and RF integrated circuits.
The system tests logic devices, microcontrollers, and system-on-chip devices.
What do the numbers mean?
Power & electrical2
- 48 PS1600 channel boards, DUT interface, RF, DCS-DPS32, measurement assemblies[1]
Configuration & options9
- ATH (Advanced Test Head)[2]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Why is probing done before packaging?General reference — not yet source-verified
Wafer-level testing allows defective devices to be identified earlier, reducing unnecessary downstream processing and helping direct later steps toward good parts.
What kinds of measurements can this class of machine perform?General reference — not yet source-verified
Such systems can perform electrical checks such as continuity, leakage, parametric measurement, and functional response testing, depending on the test program and instrumentation.
What is the main purpose of the test results?General reference — not yet source-verified
The results are used to determine whether a device meets electrical requirements and to support process monitoring and yield control.
Not publicly documented
The following facts about the 93000 PS 1600 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 93000 PS 1600 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 93000 PS 1600 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 93000 PS 1600 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 93000 PS 1600 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 93000 PS 1600 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]waferpedia.com — waferpedia.comwaferpedia.com
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]Equipment inventory listing
Last updated Oct 7, 2026.
Compare with similar tools
View all →The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
