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M6542AD TEST HANDLER WITH COLD OPTION

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Advantest M6542AD is a pick & place memory handler. The Advantest M6542AD has a temperature capability of -55°C to 130°C. The Advantest M6542AD includes a -55°C low temperature kit as an option.[1][2][3]

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What it is

General reference — not yet source-verified

Test handlers are automated machines used in semiconductor final test to transfer devices between input media and a test head, and then sort them into output bins based on test results. The pick-and-place mechanism uses vacuum pickup tools to move individual devices.

How it works

The M6542AD cold option includes a -55°C low temperature kit and a cooling unit that uses liquid nitrogen (LN2) as a coolant, with an LN2 valve controlling the flow.[2][3]

Applications

The M6542AD is a memory handler, used for testing packaged memory devices.[1]

What do the numbers mean?

Wafer handling3

Handler Type
Pick & Place Memory Handler[1]
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Description
TEST HANDLER WITH COLD OPTION[2]
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Basic configuration includes
M6542AD Handler; Device Cooling Unit; PL Label; Test Head Positioner Options; Air flow meter; LN2 Valve; Signal Tower; Keyboard (Handy + EMO); HEX Socket RL Cover; Stocker; Cooling LN2 Valve[2]
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Control & software1

System software
H4-910191 SYSTEM SOFTWARE(ENGLISH)[3]
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Configuration & options13

-Temperature capability
-55 C to 130C[2]
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-Condition
working, available for powered- up inspection based on diagnostic pass and down-payment received.[2]
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Attachments
1 Files[2]
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Cold Option (Low Temp Kit)
Included (-55°C)[2]
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Optional Temperature Stage
-40°C (cold option variant)[4]
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Manufacturer
Advantest[2]
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Model
M6542AD[2]
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-55 Degree Celsius Low Temp Kit
1 Set[2]
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M6542AD+ATIE1 Product Name
M6542AD-000-E011 WITH IC DEVICE COOLING UNIT[3]
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Low temperature kit
-55C LOW TEMPERATURE KIT (UNIT) H4-4010[3]
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Low temperature kit
-55C LOW TEMPERATURE KIT (ASSY) H4-910176[3]
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Air flow meter
H4-910390[3]
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Test head positioner
M6542ADXT5593 TEST HEAD POSITIONER H4-910347[3]
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Observed configurations

How individual machines were equipped when they appeared on the secondary market — as listed, per unit. These describe one specific machine, not the model in general.

Unit as listed[2]

  • Temperature capability from -55 C to 130C

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
M6542AD+ATIE1——Recommended pack includes a device cooling unit, contact attachment for 32/64/128 site, system software, signal tower, LN2 valve, cooling LN2 valve, stocker, -55 C low temperature kit, air flow meter, handler synchronization kit, ionizer kit, and test head positioner.jadgrp.com[3]
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

How does a test handler ensure the device is at the correct temperature when tested?General reference — not yet source-verified

The handler moves devices through a temperature-conditioning chamber or soak zone, where they are held for sufficient time to reach thermal equilibrium. The cold option supplies chilled air or equivalent cooling to maintain that desired low temperature until the moment of test contact.

What types of devices can be tested by a machine of this class?General reference — not yet source-verified

Test handlers of this class are generally designed for packaged semiconductor devices, including integrated circuits and discrete devices, that fit within the handler's input media and socket configuration. The cold option is especially relevant for devices whose cold-temperature operation must be verified.

How are devices sorted after testing?General reference — not yet source-verified

After the tester evaluates each device, the handler receives the result and mechanically transfers the device to a corresponding output bin. Bins are used to separate passing devices, failing devices, and devices with different measured performance levels.

Not publicly documented

The following facts about the M6542AD TEST HANDLER WITH COLD OPTION are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the M6542AD TEST HANDLER WITH COLD OPTION are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the M6542AD TEST HANDLER WITH COLD OPTION are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the M6542AD TEST HANDLER WITH COLD OPTION are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the M6542AD TEST HANDLER WITH COLD OPTION is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the M6542AD TEST HANDLER WITH COLD OPTION are on record.

    Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]fabsurplus.com — fabsurplus.comfabsurplus.com
  2. [2]dealer listingfabsurplus.com
  3. [3]jadgrp.com — jadgrp.comjadgrp.com
  4. [4]fabsurplus.comfabsurplus.com
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Last updated Oct 9, 2026.

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