Advantest

Plate 01Celebrating 25 Years of Innovation: The V93000 Anniversary Special
Plate 02Advantest V93000 Wave Scale RF
Plate 03V93000 EXA Scale
Plate 04Advantest V93000 Wave Scale Benefits
Plate 05Verigy V93000 Launch Video: The Best Got Better
Plate 06TechTuesday: Advantest's V93000 Wave Scale RF
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
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It is used as semiconductor automatic test equipment for chip mass production testing.[8]
The following facts about the V 93000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the V 93000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the V 93000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the V 93000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the V 93000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the V 93000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Jul 29, 2026.
The Teradyne / Eagle ETS 364 Tester is a semiconductor test system with configurable analog and digital pin units.
The Teradyne iFlex Tester is a configurable test platform with power ratings up to 28.8 kVA at 480 VAC and can be equipped with modules including HSD200, DC30, DC75, BBAC, and VHFAC.
General referenceTeradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.