Electroglas
EG 2001 X
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
General reference — not yet source-verifiedThe EG 2001 X aligns a wafer on a precision stage and brings it into contact with a probe card that contains an array of electrical probes.
The machine steps the wafer from one die site to the next, allowing a connected test system to perform parametric or functional tests on each die.
Where it fits in the process flow
General reference — not yet source-verifiedIn semiconductor manufacturing, wafer probing occurs after all front-end fabrication steps are complete and before the wafer is diced into individual die.
The prober is typically used in a test cell alongside a semiconductor test system, often in a final-test or sort operation that determines which die are functional and which are defective.
Applications
General reference — not yet source-verifiedThe Electroglas EG 2001 X is applied to dc parametric testing, functional testing, and die sorting for a variety of integrated circuit types.
What do the numbers mean?
Configuration & options1
- Spare Boards[6]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the EG 2001 X are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
Fewer than 3 independently cited specifications for the EG 2001 X are on record; the remainder await public documentation.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the EG 2001 X are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the EG 2001 X are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the EG 2001 X are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the EG 2001 X are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (7)Every fact above is drawn from these public sources
- [1]Equipment inventory listing
- [2]Equipment inventory listing
- [3]Equipment inventory listing
- [4]Equipment inventory listing
- [5]Equipment inventory listing
- [6]Inventory photo
- [7]Inventory photo
Last updated Oct 11, 2026.
