Hitachi
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The Hitachi CD-SEM S-8840 is a critical dimension scanning electron microscope used for semiconductor wafer measurement. The Hitachi CD-SEM S-8840 offers a CD measurement range of 0.1 to 10 μm and a secondary electron image resolution of 5 nm. The Hitachi CD-SEM S-8840 achieves a throughput of 26 wafers per hour.[1]

Power
500 to 1300 V (variable in 10 V steps)[1]
Vacuum
360 x 640 x 520 mm, 30 kg each (option)[1]
Performance
1 unit[3]
Optics
5 nm (50 Å) at 0.8 kV[1]
The Hitachi 8840 is a Hitachi semiconductor inspection instrument.[2]
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The following facts about the 8840 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 8840 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 8840 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 8840 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 8840 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 8840 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 29, 2026.