Hitachi
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
Power
6kVA Single Phase[2]
Gas delivery
Nitrogen, Oil free Air (OFA), PCW Glycol[3]
Optics
1000x to >300000x[3]
The S 9300 is a critical-dimension scanning electron microscope (CD-SEM). The system is classified as a metrology and inspection tool.[4][3]
The S 9300 employs a Schottky emission electron gun. The accelerating voltage is adjustable from 500V to 1600V in 10V steps. The electron optical system uses a three-stage electromagnetic lens and a two-stage electromagnetic deflection coil. Astigmatism correction is performed by an eight-pole electromagnetic coil. The probe current is 4 to 24pA with automated setting and measurement by Faraday cup. The field of view is 1.2mm. The depth of focus is at least 1.0µm at 80000x magnification. Resolution is 3nm at 800V in retarding/boosting mode. Magnification ranges from 1000x to greater than 300000x.[3]
The S 9300 handles 200mm wafers and is convertible to 300mm with a conversion kit. The system includes a 200mm wafer handling system with two cassette holders equipped with ergo flippers. The wafer imaging covers X from 5 to 295mm and Y from 5 to 195mm. The system also supports notch-down alignment.[3][2]
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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Depending on the sensing method, it can provide images, dimensional measurements, surface-condition information, or defect-location data.
Such systems are used on semiconductor and other precision-manufactured parts with small features, fine patterns, or sensitive surface conditions.
The following facts about the S 9300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S 9300 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the S 9300 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the S 9300 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the S 9300 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the S 9300 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 28, 2026.
The Thermo Fisher Scientific / FEI Quanta 450 FEG is a scanning electron microscope.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.