Keysight
4072 A Parametric
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
The 4072 A supports up to two high-power SMUs (HPSMU), up to two high-resolution SMUs (HRSMU), and up to eight total SMUs.[2]
The system includes a low-leakage switching matrix configurable from twelve to forty-eight fully-guarded Kelvin outputs, and a high-frequency switching matrix with integrated pulse generator control.[2]
Where it fits in the process flow
General reference — not yet source-verifiedParametric testers are used in semiconductor manufacturing to perform electrical testing on test structures embedded in the wafer scribe lines, providing data on process parameters after front-end-of-line (FEOL) or back-end-of-line (BEOL) processing.
Applications
The 4072 A performs direct-current (DC) measurements, capacitance measurements, flash memory cell testing, and testing of other high-frequency applications.[2]
Measurement capabilities of the 4072 A include two microvolt and one femtoamp resolution on the HRSMU, plus-minus two hundred volts and plus-minus one amp output on the HPSMU, and a one kilohertz to two megahertz capacitance frequency measurement range on the HSCMU.[2]
What do the numbers mean?
Power & electrical4
Wafer handling1
Optics & imaging1
Configuration & options7
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the 4072 A Parametric are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4072 A Parametric are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 4072 A Parametric are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 4072 A Parametric are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 4072 A Parametric are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 4072 A Parametric is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Equipment inventory listing
- [2]parametrictestsolutions.com — parametrictestsolutions.comparametrictestsolutions.com
Last updated Sep 24, 2026.
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