Keysight
The Keysight/Agilent 4142 Parametric Analyzer includes SMU modules such as the HP41421B (100V), HP41420A (200V), HP41422A (HCU), and HP41423A (HVU), all with calibration.[1]
The Keysight / Agilent 4142 Parametric Analyzer is a semiconductor test and probe instrument.[1]
A parametric analyzer applies electrical bias to semiconductor devices and measures current and voltage behavior to characterize device parameters.
A probe-based parametric test setup uses probe contacts to connect the instrument to wafers or devices before packaging.
A parametric analyzer fits into electrical characterization and wafer-level test flow.
A probe-based analyzer is used after device fabrication and before final assembly when electrical measurements are needed at the die or wafer level.
A parametric analyzer is used for semiconductor device characterization, leakage measurement, threshold-related measurements, and other electrical tests on transistors and similar structures.
A probe-based parametric analyzer is used on wafers, dies, and test structures during development, qualification, and production test.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The Keysight / Agilent 4142 Parametric Analyzer is a semiconductor test and probe instrument.[1]
The following facts about the 4142 Parametric Analyzer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4142 Parametric Analyzer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 4142 Parametric Analyzer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 4142 Parametric Analyzer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 4142 Parametric Analyzer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 4142 Parametric Analyzer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 6, 2026.
The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.