Keysight
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The Keysight 4155 C Semiconductor Parameter Analyzer is a semiconductor parameter analyzer. The 4155 C Semiconductor Parameter Analyzer supports dc or pulsed force/measure and stress force. The 4155 C Semiconductor Parameter Analyzer includes Desktop EasyEXPERT standard edition.[1][2]
The 4155 C supports setting measurement and stress conditions, controlling execution, performing arithmetic calculations, displaying measured and calculated results, performing graphical analysis, storing and recalling setups and data, producing hardcopy output, and using built-in instrument BASIC.[2]
The 4155 C is used to measure device behavior during evaluation of semiconductor structures, where engineers can apply bias, stress, and sweep conditions and review the resulting electrical data.[2]
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| 4156C | — | — | Precision Semiconductor Parameter Analyzer; the data sheet distinguishes it from the 4155C Semiconductor Parameter Analyzer. | testequipmenthq.com[2] |
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The 4155 C can set measurement and stress conditions, control measurement and stress execution, perform arithmetic calculations, display measured and calculated results, perform graphical analysis, store and recall setups and data, dump data to printers or plotters, and perform measurement and analysis with built-in instrument BASIC.[2]
The 4155 C supports graphical analysis, on-screen display of measured and calculated results, and storage and recall of measurement setups and measurement or graphical display data.[2]
The following facts about the 4155 C Semiconductor Parameter Analyzer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4155 C Semiconductor Parameter Analyzer are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the 4155 C Semiconductor Parameter Analyzer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 4155 C Semiconductor Parameter Analyzer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 4155 C Semiconductor Parameter Analyzer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the 4155 C Semiconductor Parameter Analyzer are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 8, 2026.
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