Waferpedia

KLA

F 60

Metrology & InspectionKLA F 60 family
Research Quality: 20% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

KLAF 60
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What is it?

KLA F 60 is a film thickness measurement tool used in semiconductor metrology and inspection.

What do the numbers mean?

Wafer handling2

Wafer size
8 inch[1]
Accurate?
Wafer Handling
x1 Open Cassette Loader[1]
Accurate?

Control & software1

Software version
2.7.0.0[1]
Accurate?

Configuration & options2

Category
Metrology & Inspection[1]
Accurate?
Family
KLA F[1]
Accurate?
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Where are the manuals?

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Not publicly documented

Field notes

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Not publicly documented

The following facts about the F 60 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the F 60 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the F 60 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the F 60 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the F 60 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the F 60 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]waferpedia.comwaferpedia.com
  2. [2]Equipment inventory listing
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Last updated Sep 25, 2026.

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