KLA
The KLA P 17 Surface is a surface profilometer in metrology and inspection. The KLA P 17 Surface uses a stylus profiler for step height and surface roughness measurements. The KLA P 17 Surface supports 2D and 3D measurements.[1][2]

The KLA P 17 Surface is a surface profilometer in metrology and inspection.[1][3]
A stylus profiler is used to measure step height and surface roughness, and related measurements can include bow and stress.[2]
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Tencor P-17 OF | — | — | Open Frame version with a bigger frame for larger samples; can be configured for 300 mm wafers or a 240 x 240 mm chuck. | kla.com[2] |
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The P-17 stylus profilometer measures step heights from a few nanometers to one millimeter.[2]
The system supports scans up to 200 mm without stitching.[2]
The P-17 can be configured for 300 mm wafers, or with a 240 x 240 mm chuck. The P-17 OF (Open Frame) variant provides a larger frame for larger samples.[2]
The following facts about the P 17 Surface are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 17 Surface are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the P 17 Surface are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the P 17 Surface are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the P 17 Surface is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the P 17 Surface are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 5, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.