KLA
The KLA Profilm 3 D Optical is a non-contact optical profilometer for three-dimensional surface topography measurement.[4][3]
The Profilm 3 D Optical is part of the KLA Instruments metrology and inspection category.[5]
The Profilm 3 D Optical fits in metrology and inspection workflows where surface form, step height, roughness, and other topographic features are measured after fabrication or processing.[3]
The Profilm 3 D Optical measures step height, surface roughness, trench and via depth, dimensions, particles, grains, volume, bearing ratio, and flatness.[3]
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The following facts about the Profilm 3 D Optical are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Profilm 3 D Optical are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Profilm 3 D Optical are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Profilm 3 D Optical are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Profilm 3 D Optical are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Profilm 3 D Optical is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 10, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.