Waferpedia

Multitest

MT 9510 XP

Test & ProbeMultitest MT 9510 family
Research Quality: 40% complete

The Multitest MT 9510 XP is a Pick&Place handler designed for tri-temp testing of semiconductor packages. The Multitest MT 9510 XP uses standard Plunge-to-Board contacting and delivers industry-leading temperature accuracy without modifications.[1]

MT 9510 XP — Inventory photo
Fig. 01MT 9510 XPInventory photo[2]

What it is

The Multitest MT 9510 XP is a Pick-and-Place handler for semiconductor final test. The MT 9510 XP is designed for tri-temp (hot, ambient, cold) testing of integrated circuits. The machine provides tri-temp handling capability with a temperature range that includes hot and cold testing. The MT 9510 XP is a model that supports ambient, hot, and cold (three-temperature) operation. Some units include a 3MTM (three-temperature) configuration. Some units are configured with an IEEE 488.2 interface and an ionizer kit. Some units include an RGB sensor for the 3MTM system. The MT 9510 XP is a handler model that can be equipped with conversion kits for specific package types such as QFP (Quad Flat Package).[5][2][3][6][1]

How it works

A Pick-and-Place handler moves individual devices from input trays or tubes to a test socket, where the tester contacts the device leads, and then sorts the devices into output bins based on test results. The MT 9510 XP uses a standard Plunge-to-Board contacting method for making electrical connections to the device under test. The temperature accuracy of the handler is measured directly on the device under test (DUT). The machine can maintain temperature accuracy for medium to long test times without requiring additional changes or add-ons. The MT 9510 XP can be configured with a quad-site contact unit holder for multi-site testing. The contact unit can support short contacts and tri-temp operation with hot air purge.[1][3]

Why won't it start?

Documented failure modes, common issues, and field considerations.

  • Non operational

What do the numbers mean?

Power & electrical4

50/60 Hz[3]
Accurate?
Phase
3 Phase[3]
Accurate?
Power supply
50/60 Hz, 3 Phase[3]
Accurate?
Power
50/60 Hz, 3 Phase[3]
Accurate?

Control & software3

Option IEEE 488.2 Interface[3]
Accurate?
Interface
IEEE 488.2 (optional)[3]
Accurate?
Options
IEEE 488.2 Interface, Ionizer Kit, RGB Sensor[3]
Accurate?

Configuration & options25

A+H with 3MTM[5]
Accurate?
Non operational[5]
Accurate?
Temperature
3T[2]
Accurate?
Class ESD
0 with closed loop[2]
Accurate?
Included Options:[3]
Accurate?
MT 9510 XP Base System Ambient / Hot 3MTM[3]
Accurate?
Option Ionizer Kit MT 9510 XP Incl. Cooler[3]
Accurate?
Option RGB Sensor 3MTM[3]
Accurate?
Included Conversion Kit:[3]
Accurate?
CK QFP 48 7x7 Quad site[3]
Accurate?
Conversion Kit Quad Site Compatible with MT 9510 / MT 9510 XP for QFP Basic ESD Protection[3]
Accurate?
Contact Unit Holder Quad Site:[3]
Accurate?
Compatible with MT 9510 / MT 9510 XP Short contact[3]
Accurate?
Tri-temp with Hot Air Purge[3]
Accurate?
Tri-temp[6]
Accurate?
Temperature capability
Tri-temp (hot and cold)[1]
Accurate?
Package type
BGA 416 (27x27 mm body)[1]
Accurate?
Contacting method
Standard Plunge-to-Board contacting[1]
Accurate?
ESD class
0 with closed loop[2]
Accurate?
Optional accessories
Ionizer kit, RGB sensor[3]
Accurate?
Conversion kit
QFP 48 7x7 quad site[3]
Accurate?
Temperature
Tri-temp (3T)[2]
Accurate?
Conversion kits
CK QFP 48 7x7 Quad site, Conversion Kit Quad Site for QFP Basic ESD Protection Contact Unit Holder Quad Site[3]
Accurate?
Contacting
Plunge-to-Board[1]
Accurate?
Package tested
BGA 416, 27x27 mm body size[1]
Accurate?

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
MT 9510 XP Handler - A+H with 3MTM—2007—Equipment inventory listing[5]
MT 9510 XP Handler - Temperature: 3T - Class ESD: 0 with closed loop—2007—Equipment inventory listing[2]
MT 9510 XP Handler - 50/60 Hz - 3 Phase—2022—Equipment inventory listing[3]
Interested in this tool?
Need help with this tool?Embed spec card

What replaced it?

Alternatives

Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.

What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Configuration50/60 Hz[3]
  • Phase3 Phase[3]
  • Power supply50/60 Hz, 3 Phase[3]
  • Power50/60 Hz, 3 Phase[3]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Worked with this tool? Help preserve its knowledge →

Frequently asked questions

What types of semiconductor devices can be tested on test and probe systems?General reference — not yet source-verified

Test and probe systems can handle a broad range of devices including logic ICs, memory chips, analog and mixed-signal circuits, RF components, MEMS sensors, and power devices. The specific test interface and instrumentation are configured according to the device type and test requirements.

What is the difference between a wafer prober and a package handler?General reference — not yet source-verified

A wafer prober contacts devices directly on the wafer using a probe card, allowing electrical tests before dicing. A package handler handles individual packaged devices, placing them into a test socket for final test after packaging. Both automate device handling and sorting but operate at different stages of the manufacturing flow.

How is test throughput determined in such systems?General reference — not yet source-verified

Throughput depends on factors such as test time per device, contact and index time (mechanical movements), parallel test capability (number of sites tested simultaneously), and handling speed. System designers optimize these parameters based on the specific device and production volume requirements.

What are common test parameters measured by these systems?General reference — not yet source-verified

Typical test parameters include DC measurements (leakage current, supply voltage thresholds), AC parameters (timing, rise/fall times), functional logic patterns, analog signal integrity (gain, distortion), and parametric values (resistance, capacitance). The specific tests are defined by the device datasheet and test program.

Not publicly documented

The following facts about the MT 9510 XP are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MT 9510 XP are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the MT 9510 XP are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • The process node or technology generation of the MT 9510 XP is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the MT 9510 XP are on record.

    Answerable by: an OEM parts catalog or a service engineer

  • No publicly hosted manuals, SOPs, or datasheets for the MT 9510 XP are on record.

    Answerable by: university cleanroom staff or an OEM application specialist

Sources & citations

Sources (7)Every fact above is drawn from these public sources
  1. [1]web.archive.org — multitest.com (Mar 21, 2006)web.archive.org
  2. [2]Inventory photo
  3. [3]Inventory photo
  4. [4]Inventory photo
  5. [5]inventory listing
  6. [6]inventory listing
  7. [7]Equipment inventory listing
Was this page accurate?

Last updated Sep 29, 2026.

Compare with similar tools

View all →