Waferpedia

Comparison ledger

0010-03254 E ChuckversusWAM 5500

Applied Materials 0010-03254 E Chuck, Seiko Epson WAM 5500, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0010-03254 E ChuckApplied Materials
WAM 5500Seiko Epson
OEMApplied MaterialsSeiko Epson
Category——
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
Family—Seiko Epson WAM 5500
Specifications
Refractive Measurement Range (Sphere)—-22D ~ +22D (VD=0)[1]
Cylinder Measurement Range—0D ~ ±10D (VD=0)[1]
Axis Measurement Range—0° ~ 180°, step 1°[1]
Minimum Pupil Diameter Measurable—Ф2.3 mm[1]
Corneal Curvature Radius Measurement Range—5.0 mm ~ 10.0 mm[1]
Corneal Refractivity Range—33.75D ~ 67.5D (n=1.3375)[1]
Degree of Corneal Astigmatism Range—0D ~ ±9D[1]
Pupil Diameter Measurement Range—Ф2.0 ~ 8.0 mm, step 0.1 mm[1]
PD Measurement Range—85 mm, step 1 mm[1]
Measurement Time (Refractive)—approx. 0.07 second[1]
Measurement Time (Pupil Diameter)—approx. 0.07 second[1]
Measurement Time (Corneal Curvature Radius)—approx. 2.2 seconds[1]
Continuous Measurement Interval—0.2 seconds (when connected to PC)[1]
Dimensions (W × D × H)—327 mm × 496 mm × 515 mm[1]
Weight—approx. 20 kg[1]
Power Supply—AC 100 - 240 V, 50/60 Hz, 80 VA[1]
Data Output Interface—RS-232C[1]
Monitor—5.7 inch color LCD[1]
Sources (1)Every fact above is drawn from these public sources
  1. [1]rexxam.co.jprexxam.co.jp