Waferpedia

Comparison ledger

1.112 PSL WaferversusSP5

KLA 1.112 PSL Wafer, Leica SP5, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
SP5Leica
OEMKLALeica
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA 1.112 PSL WaferLeica SP5
Specifications
ConfigurationNIST Traceable[1]—
Wafer Size8 inch[1]—
NIST TraceableTrue[1]—
Compatible ToolsSurfscan 6xy0 and Sp1[2]—
Manual title—Leica SP5 Inverted Confocal Manual[3]
System type—Spectral confocal and multiphoton microscope system[4]
Detection module—SP spectral detection module[4]
Spectral band selection—Any spectral emission band in the visible range; five spectral bands can be selected simultaneously[4]
FLIM operation—Two detectors may operate as a sensor for fluorescence lifetime imaging microscopy (SP-FLIM combination)[4]
Confocal channels—Up to five confocal channels simultaneously[5]
Detectors—High dynamic sensors with low dark current PMTs[5]
Spectrometer—High efficiency prism spectrometer with loss-free band selection[5]
Conventional scanner features—True confocal point-scanning; extra large field of view (21 mm); 64 Megapixel images (8k x 8k); beam park data acquisition; spot-bleaching FRAP; zoom and pan function; slow scan mode[5]
Resonant scanner features—True confocal point-scanning; large field of view (15 mm); zoom and pan function; 16,000 lines per second; 250 frames per second; 25 frames per second 512 x 512; up to five confocal channels simultaneously[5]
Tandem Scanner—Conventional and resonant scanner in one system; switch by computer controlled super precision mechanical actuator[5]
Laser lines—405, 458, 476, 488, 496, 514, 543, 594, and 633 nm[6]
Emission channels—Customizable to 4 channels at Boston University Cellular Imaging Core[6]
Microscope stands—Inverted stand DMI 4000/6000 CS and upright stand DM 5000/6000 CS[7]
Software—Leica Application Suite Advanced Fluorescence (LAS AF)[7]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (7)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]microscopy.duke.edumicroscopy.duke.edu
  4. [4]doi.orgdoi.org
  5. [5]biology.uiowa.edubiology.uiowa.edu
  6. [6]bumc.bu.edubumc.bu.edu
  7. [7]research.uky.eduresearch.uky.edu