Veeco
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The Veeco RF 350 Ion Beam is a high-precision, automated, single-substrate loadlocked production system designed for ion beam etching (IBE) and Reactive Ion Beam Etching (RIBE). The RF 350 uses a 300mm diameter, inductively coupled, filamentless RF ion source that provides highly collimated beams.[1][2][3]
Ion beam etching removes material by directing a beam of ions at a substrate surface under vacuum.
Ion beam etching is used as a physical etch process when directional removal and profile control are needed.
Ion beam etch tools sit in the dry etch part of the process flow and are used after pattern definition to transfer a pattern into the underlying film.
Ion beam etching is used for patterned removal of films where directional etching is important.
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Ion beam etching is compatible with a wide range of materials, including silicon, gallium arsenide, metals (aluminum, gold, copper), dielectrics (silicon dioxide, silicon nitride), magnetic films, and optical coatings. The process is primarily physical sputtering, so essentially any solid material can be etched, though the rate depends on the sputter yield of the target material.
Ion beam etching typically provides superior anisotropy because the ion direction is controlled by the extraction grid, resulting in highly directional etching with minimal lateral erosion. Reactive ion etch relies on an electric field in a plasma to direct ions, which can lead to some undercut in high-aspect-ratio features. Ion beam etch is therefore preferred when vertical sidewalls are critical.
The ion source, especially the RF discharge chamber and grid assembly, requires periodic cleaning and replacement due to sputter erosion and deposition of etch by-products. The neutralizer filament also has a finite lifetime. Regular preventive maintenance includes checking grid alignment, cleaning the chamber, and replacing aging components to maintain beam uniformity and process repeatability.
Uniformity is managed by rotating the substrate during etching and by adjusting beam scanning or substrate tilt. Many systems also incorporate a Faraday array to measure the ion current density profile and correct it via grid adjustments or by varying the beam scan pattern. Chamber design and pressure control also contribute to across-wafer etch rate uniformity.
Ion beam etching can be used for both patterned and blanket etching. For patterned substrates, the directionality of the beam preserves the mask features. For blanket etching, it is used for uniform thinning (ion milling) or surface cleaning. The process is not selective in a chemical sense, so all exposed material is removed at a rate determined by its sputter yield and the incident ion angle and energy.
The following facts about the RF 350 Ion Beam are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the RF 350 Ion Beam are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the RF 350 Ion Beam are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the RF 350 Ion Beam are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the RF 350 Ion Beam are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the RF 350 Ion Beam is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 29, 2026.
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